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dc.contributor.authorLi, Linlin
dc.contributor.authorFleming, Andrew J.
dc.contributor.authorYong, Yuen Kuan
dc.contributor.authorAphale, Sumeet S.
dc.contributor.authorZhu, LiMin
dc.date.accessioned2024-03-14T00:09:08Z
dc.date.available2024-03-14T00:09:08Z
dc.date.issued2022-07-01
dc.identifier214421204
dc.identifierad103f05-058f-4648-a943-768ccdbdc3d5
dc.identifier85127303622
dc.identifier.citationLi , L , Fleming , A J , Yong , Y K , Aphale , S S & Zhu , L 2022 , ' High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control ' , Mechanical Systems and Signal Processing , vol. 173 , 109027 . https://doi.org/10.1016/j.ymssp.2022.109027en
dc.identifier.issn0888-3270
dc.identifier.otherORCID: /0000-0002-1691-1648/work/115134579
dc.identifier.urihttp://aura-test.abdn.ac.uk/handle/2164/20225
dc.descriptionAcknowledgments This work was partially supported by the National Natural Science Foundation of China under Grant Nos. 52105581, U2013211, and 51975375, the China Postdoctoral Science Foundation (No. 2021M692065), and the Open Founda­tion of the State Key Laboratory of Fluid Power and Mechatronic Systems, China under Grant No. GZKF-202003, and the CDSC Scholarship, University of Newcastle, Australia, awarded to Linlin Li.en
dc.format.extent12
dc.format.extent17766070
dc.language.isoeng
dc.relation.ispartofMechanical Systems and Signal Processingen
dc.subjectatomic force microscopyen
dc.subjectraster scanningen
dc.subjecttracking controlen
dc.subjectrepetitive controlen
dc.subjectcross-couplingen
dc.subjectTA Engineering (General). Civil engineering (General)en
dc.subject.lccTAen
dc.titleHigh Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Controlen
dc.typeJournal articleen
dc.contributor.institutionUniversity of Aberdeen.Engineeringen
dc.contributor.institutionUniversity of Aberdeen.Centre for Applied Dynamics Research (CADR)en
dc.description.statusPeer revieweden
dc.identifier.doihttps://doi.org/10.1016/j.ymssp.2022.109027
dc.date.embargoedUntil2023-03-07
dc.identifier.vol173en


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