High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control
Publication date
01/07/2022Metadata
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Li , L , Fleming , A J , Yong , Y K , Aphale , S S & Zhu , L 2022 , ' High Performance Raster Scanning of Atomic Force Microscopy Using Model-free Repetitive Control ' , Mechanical Systems and Signal Processing , vol. 173 , 109027 . https://doi.org/10.1016/j.ymssp.2022.109027